Contracts › 1333ND26PNB030039
1333ND26PNB030039: OU03-FY26-194-NEW Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) With 5 Years Service/Maintenance.
Awarded to Fei Company by National Institute of Standards and Technology (NIST).
$4.5Mobligated
$4.5Mpotential value
26 March 2027current end date
See modifications, all subcontractors and funding in FedSift →
| Contract | 1333ND26PNB030039 |
|---|---|
| Awardee | Fei Company |
| Awarding agency | National Institute of Standards and Technology (NIST) |
| Awarding office | DEPT OF COMMERCE NIST |
| NAICS | 334516 Analytical Laboratory Instrument Manufacturing |
| PSC | 5961 Semiconductor Devices and Associated Hardware |
| Place of performance | MD |
| Offers received | 2 |
| Period of performance | 27 March 2026 to 26 March 2027 |
| Potential end | 26 March 2032 |
| Estimated recompete solicitation | Now / imminent (estimate, ~6 months before expiry) |
Source: USASpending.gov (FPDS), public federal procurement data, as the agency reported it. Our record updated 03 October 2026. The solicitation date is an estimate from the end date, not a posted date.
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